An X-Ray Study of Thermally Induced Stresses in Microconstituents of Aluminum-Silicon Alloys
- 1 September 1950
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 21 (9) , 853-854
- https://doi.org/10.1063/1.1699773
Abstract
The changing width of high angle Debye x-ray diffraction lines from eutectiferous aluminum-silicon alloys during thermal cycling as measured by a recording Geiger counter spectrometer is interpreted in terms of stresses resulting from the differences in thermal expansion of the microconstituents.This publication has 2 references indexed in Scilit:
- The Royal Naval Scientific ServiceNature, 1944
- The Focusing of Electrons in an X-Ray TubeReview of Scientific Instruments, 1937