Shelf and operating life studies on SiO protected CdSe thin-film triodes

• 1 January 1965
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 53  (1) , 92-93
• https://doi.org/10.1109/PROC.1965.3542

Abstract

Keywords

• PROTECTION
• CIRCUIT TESTING
• THIN FILM TRANSISTORS
• FABRICATION
• ELECTRODES
• DEGRADATION
• STABILITY
• LIFE TESTING
• PERFORMANCE EVALUATION
• AGING