Use of hafnium dioxide in multilayer dielectric reflectors for the near uv
- 1 February 1977
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 16 (2) , 439-444
- https://doi.org/10.1364/ao.16.000439
Abstract
We measured the refractive index of layers of hafnium dioxide that were prepared by evaporation in a vacuum. It is transparent to wavelengths as short as 230 nm. Its refractive index at 300 nm was as high as 2.10 or as low as 1.90, depending upon the conditions of evaporation. Tests at Los Alamos Scientific Laboratory indicate that its laser damage threshold is approximately 2 J/cm2 at a wavelength of 355 nm. Multilayer dielectric mirrors were prepared using hafnium dioxide and silicon dioxide. The radiant reflectance exceeded 99% at a wavelength of 320 nm.Keywords
This publication has 6 references indexed in Scilit:
- Reactively Evaporated Films of Scandia and YttriaApplied Optics, 1973
- Thin films of metal oxides on silicon by chemical vapor deposition with organometallic compounds. IJournal of Crystal Growth, 1972
- Measurement of laser mirror loss using a low-finesse scanning interferometerOptics Communications, 1970
- Absorption Spectra of Zirconium and Hafnium DioxidesThe Journal of Chemical Physics, 1965
- Zur Theorie der Wechselschichten aus schwachabsorbierenden Substanzen und ihre Verwendung als InterferometerspiegelAnnalen der Physik, 1960
- Optical Properties of Various Evaporated Rare Earth Oxides and Fluorides*Journal of the Optical Society of America, 1959