Creep at intermediate temperatures : An in situ study of the evolution of the cell boundaries in the high voltage electron microscope
- 28 February 1978
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 12 (2) , 157-160
- https://doi.org/10.1016/0036-9748(78)90155-2
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Phenomenological and structural analysis of recovery-controlled creep, with special reference to the creep of single-crystal silver chloridePhilosophical Magazine, 1975
- Glissement {110} 〈110〉 dans les metaux de structure cubique a faces centreesActa Metallurgica, 1973
- Sub-grain boundary migration in aluminiumPhilosophical Magazine, 1972