Supply-current analysis (scan) as a screen for bipolar integrated circuits
- 6 July 1978
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 14 (14) , 434-436
- https://doi.org/10.1049/el:19780291
Abstract
A novel technique utilising the analysis of supply-current variations is proposed as a screen for digital integrated circuits. The application of the method to a simple m.s.i. circuit is used to demonstrate its capability of indicating the presence of flaws at internal circuit nodes.Keywords
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