KTC noise on direct injection from IR diodes
- 1 May 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 27 (5) , 998-1000
- https://doi.org/10.1109/T-ED.1980.19973
Abstract
When a MOSFET is used to transfer the photogenerated charge from an IR diode to the input of a CCD in the "direct-injection" mode, Johnson-Nyquist noise on the MOSFET transconductance results in a variance in the charge integrated in the CCD which is approximately equal to KTC under the assumption of large diode resistance, where C is the detector capacitance.Keywords
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