Microprocessor-controlled densitometer for electron diffraction

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Abstract
A densitometer to measure a large number of individual data points along a circle of a gas-phase electron diffraction pattern, recorded photographically, is described. The instrument combines a Z8 microprocessor with an improved Elscan E2500 densitometer, resulting in easy operation, high speed, high accuracy and great flexibility in later data processing. The analogue output of the light photometering system is digitised by a AD-574 kD ADC. The position of the sampling points on the measuring circle is determined with the help of a synchronisation subprogram which couples the measuring cycle to the actual spinning speed of the photographic plate.