Oxidation of Copper between 250° and 450°C and the Growth of CuO “Whiskers”
- 1 January 1961
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 108 (2) , 119-123
- https://doi.org/10.1149/1.2428024
Abstract
Thin oxide whiskers have been found to grow on copper by a number of investigators. The relation of these growths to the mechanism of oxidation and to changes in the kinetics of oxidation remains to be established. To answer these questions a study was made of the oxidation of copper using the vacuum microbalance method to determine the kinetics of reaction, x‐ray and electron diffraction methods for study of the oxide crystal structures, and a high resolution electron microscope to determine the size and surface density of the oxide whiskers.Keywords
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