Structural Investigation of Microcrystalline Silicon

• 1 September 1994
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 173-174, 249-254
• https://doi.org/10.4028/www.scientific.net/msf.173-174.249

Abstract

Keywords

• MICROCRYSTALLINITY
• PERCOLATION
• RAMAN SPECTROSCOPY
• TEM