SPELEEM: Combining LEEM and Spectroscopic Imaging

This publication has 14 references indexed in Scilit:

• Au on Ag/Si(111)-($\sqrt{3}$$\times$$\sqrt{3}$)R30°: A spectromicroscopy study of a bimetal-silicon interface
  Physical Review B, 1997
• Multipole WIEN-filter for a high-resolution X-PEEM
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• Recent progress in photoemission microscopy with emphasis on chemical and magnetic sensitivity
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• PISAM: a photon-induced scanning Auger microscope
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• Photoelectron spectromicroscopy with synchrotron radiation: applications to neurobiology
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• A photoemission microscope with a hemispherical capacitor energy filter
  Journal of Electron Spectroscopy and Related Phenomena, 1997
• New Magnetic Linear Dichroism in Total Photoelectron Yield for Magnetic Domain Imaging
  Physical Review Letters, 1995
• An electrostatic microscope for synchrotron radiation x-ray absorption microspectroscopy (invited)
  Review of Scientific Instruments, 1992