Hot-Carrier Detrapping Mechanisms in MOS Devices

• 20 November 1989
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 28  (Part 2, No) , 2047-2049
• https://doi.org/10.1143/jjap.28.2047

Abstract

Keywords

• DETRAPPING MECHANISMS
• MOS DEVICES
• HOT CARRIER DETRAPPING