Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences
- 1 January 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-20 (1) , 25-32
- https://doi.org/10.1109/t-c.1971.223077
Abstract
This paper deals with a fault detection and diagnosis technique based on Boolean differences. A brief review of the notion of a Boolean difference is presented, and the concept of partial Boolean difference is introduced. An algorithm for obtaining minimal, complete sets of test-input sequences based on the partial Boolean differences of a switching function is formulated, and illustrations demonstrating the use of the technique are presented.Keywords
This publication has 8 references indexed in Scilit:
- A method of automatic fault-detection test generation for four-phase MOS LSI circuitsPublished by Association for Computing Machinery (ACM) ,1969
- Analyzing Errors with the Boolean DifferenceIEEE Transactions on Computers, 1968
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Fault Detection in Redundant CircuitsIEEE Transactions on Electronic Computers, 1967
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966
- Redundancy and complexity of logical elementsInformation and Control, 1963
- On Codes for Checking Logical OperationsIBM Journal of Research and Development, 1959
- Error Detecting and Error Correcting CodesBell System Technical Journal, 1950