Statistical properties of energy- and angle-selected secondary electron emission

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Abstract
The method and first results are presented for an experimental examination of the statistics of secondary electron emission detected within narrow intervals of energy and solid angle. It is shown that, at least down to 120 electrons per signal sample, the process is governed by the statistics of an ideal electron gas, i.e. the electron count behaves as a random variable with the properties of white Gaussian noise whose variance is approximately equal to the square root of the count.

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