Scanning Tunnelling Microscopy Study of Si(111) 7×7 in the Presence of Multiple-Step Edges
- 1 May 1990
- journal article
- Published by IOP Publishing in Europhysics Letters
- Vol. 12 (1) , 57-61
- https://doi.org/10.1209/0295-5075/12/1/011
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- External-charge-induced surface reconstruction on Ag(110)Physical Review Letters, 1989
- Investigation of Bloch wall fine structures by magnetic force microscopyJournal of Microscopy, 1988
- Image processing techniques for obtaining registration information with scanning tunneling microscopyJournal of Vacuum Science & Technology A, 1988
- Tunneling microscopy of steps on vicinal Ge(001) and Si(001) surfacesJournal of Vacuum Science & Technology A, 1988
- Reconstruction of steps on the Si(111)2×1 surfacePhysical Review Letters, 1987
- Tunneling images of biatomic steps on Si(001)Physical Review Letters, 1987
- Technique for shaping scanning tunneling microscope tipsReview of Scientific Instruments, 1987
- Tunneling Images of Atomic Steps on the Si(111)7×7 SurfacePhysical Review Letters, 1985
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- Reflection Electron Microscope Observations of Dislocations and Surface Structure Phase Transition on Clean (111) Silicon SurfacesJapanese Journal of Applied Physics, 1980