Measurements of the absolute spectral sensitivity of X-ray semiconductor detectors in the photon energy range of 1.5–15 keV using “white” SR beam of the VEPP-3 storage ring
- 1 May 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 359 (1-2) , 427-431
- https://doi.org/10.1016/0168-9002(94)01672-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Electron storage ring BESSY as a source of calculable spectral photon flux in the x-ray regionReview of Scientific Instruments, 1992
- X-ray lithography at the VEPP-3 storage ringReview of Scientific Instruments, 1992
- Measurements of absolute sensitivity of semiconductor detectors for 7–20 keV x rays using synchrotron radiation of VEPP-3 storage ringReview of Scientific Instruments, 1992
- Response of amorphous silicon p-i-n detectors to ionizing particlesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- A New Method of Constrained Optimization and a Comparison With Other MethodsThe Computer Journal, 1965