Automatic measurement of the work function variation on microsurfaces
- 1 March 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (3) , 176-178
- https://doi.org/10.1088/0022-3735/9/3/011
Abstract
Reflection electron microscopy allows the measurements of variations in work function on microsurfaces. A treatment of the microscope response signal is described, which allows continuous measurement to be made. For this purpose, a phase sensitive technique of detection is used, and a servomechanism using a particular point of the response curve is developed.Keywords
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