Crystal Interference Phenomena in Electron Microscope Images

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Abstract
The observation of electron reflections in electron microscope images is reviewed and further data are presented. The observations of the reflected beams with the objective limiting diaphragm removed and the determination of the planes responsible for the reflections by this means are described. The results of the dynamical theory of electron diffraction are briefly discussed and the values of the ``characteristic'' crystal thickness D0 are computed. These values of D0 are compared with the experimental values and are in reasonably good agreement for the MgO (200) reflections at 60, 96, and 103 kv, MgO (220) reflections and CdO (200) reflections at 60 kv. The dynamical theory accounts satisfactorily for the intensity variations except as modified by inelastic scattering and the results may be considered as experimental verification of the theory.