Syndrome-testable internally unate combinational networks
- 4 August 1983
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 19 (16) , 637-638
- https://doi.org/10.1049/el:19830434
Abstract
A combinational network is syndrome-testable with respect to a particular fault if the faulty network realises a function with a different number of ones from the function realised by the fault-free network. Here we investigate the syndrometestability of single stuck-at faults in internally unate combinational networks. We show how such a network can be made syndrome-testable for single stuck-at faults by the addition of a single control line. In the case of a two-level network, at most one additional first-level gate is added to the network.Keywords
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