Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) Effects
- 1 June 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (6)
- https://doi.org/10.1143/jjap.19.1203
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Depth profiles of ion-induced structural changes in diamond from X-ray photoelectron spectroscopyProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1978
- Influence of radiation damage on the diffraction of X-ray photoelectronsRadiation Effects, 1978
- Angular-dependent x-ray-photoelectron peak intensities from single-crystal goldPhysical Review B, 1977
- Auger study of preferred sputtering on binary alloy surfacesSurface Science, 1976
- Solid state—and surface—analysis by means oF angular-dependent x-ray photoelectron spectroscopyProgress in Solid State Chemistry, 1976
- Attenuation lengths of low-energy electrons in solidsSurface Science, 1974
- Surface sensitivity and angular dependence of X-ray photoelectron spectraSurface Science, 1973