A Method for Quantitative Phase Analysis of Silicon Nitride by X-Ray Diffraction
- 1 September 1990
- journal article
- research article
- Published by Cambridge University Press (CUP) in Powder Diffraction
- Vol. 5 (3) , 121-124
- https://doi.org/10.1017/s0885715600015530
Abstract
The relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y2Si2O7) and nitrogen apatite [Y5(SiO4)3N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.Keywords
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