Dielectric properties of polystyrene thin films formed by rf electrodeless excitation
- 1 December 1976
- journal article
- letter
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 47 (12) , 5480-5481
- https://doi.org/10.1063/1.322545
Abstract
The temperature coefficient of the dielectric constant for the common polystyrene films is negative, while that for films formed by rf electrodeless excitation is positive. From the measurements of the coefficient of linear expansion and of thermally stimulated current (TSC), it is found that the negative coefficient for the polystyrene films is due to the expansion of volume, while on the other hand, the positive coefficient for the thin films is due to the occurrences of dipoles having widely distributed relaxation times.This publication has 4 references indexed in Scilit:
- Measurement of dipolar relaxation times and dielectric constants using thermally stimulated currentJournal of Applied Physics, 1975
- Growth Rate of Polystyrene Films Formed by Electrodeless R-F ExcitationJapanese Journal of Applied Physics, 1973
- Ionic Thermocurrents in DielectricsPhysical Review B, 1966
- Dielectric losses in polymer films formed by a dischargeProceedings of the Institution of Electrical Engineers, 1965