LAMP: Automatic Test Generation for Asynchronous Digital Circuits
- 1 October 1974
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 53 (8) , 1477-1503
- https://doi.org/10.1002/j.1538-7305.1974.tb02801.x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Boolean Difference for Fault Detection in Asynchronous Sequential MachinesIEEE Transactions on Computers, 1971
- A Heuristic Algorithm for the Testing of Asynchronous CircuitsIEEE Transactions on Computers, 1971
- A model and implementation of a universal time delay simulator for large digital netsPublished by Association for Computing Machinery (ACM) ,1970
- Analyzing Errors with the Boolean DifferenceIEEE Transactions on Computers, 1968
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966