A Unified Approach to Yield Analysis of Defect Tolerant Circuits

Publisher Website

1 January 1990

book chapter
Published by Springer Nature

p. 33-45
https://doi.org/10.1007/978-1-4757-9957-6_3

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

Modeling defect spatial distribution
IEEE Transactions on Computers, 1989
Small-area fault clusters and fault tolerance in VLSI circuits
IBM Journal of Research and Development, 1989
Yield Models for Defect-Tolerant VLSI Circuits: A Review
Published by Springer Nature ,1989
Correlation analysis of particle clusters on integrated circuit wafers
IBM Journal of Research and Development, 1987