Application of ion chromatography to failure analysis of electronics packaging
- 31 December 1991
- journal article
- Published by Elsevier in Journal of Chromatography A
- Vol. 546, 347-350
- https://doi.org/10.1016/s0021-9673(01)93033-x
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- An XPS study of air corona discharge-induced corrosion products at Cu, Ag and Au ground planesApplied Surface Science, 1988
- The Determination of Trace Inorganic Contaminants in PolyimidesIEEE Transactions on Electrical Insulation, 1983