Electromagnetic particle-in-cell simulations of Applied-B proton diodes
- 1 January 1986
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 59 (1) , 11-18
- https://doi.org/10.1063/1.336851
Abstract
Fully electromagnetic particle‐in‐cell simulations of Applied‐B ion diodes have been performed using the magic code. These calculations indicate that Applied‐B diodes can be nearly 100% efficient. Furthermore, the simulations exhibit an impedance relaxation phenomenon due to the buildup of electron space charge near the anode which causes a time‐dependent enhancement of the ion emission above the Child–Langmuir value. This phenomenon may at least partially explain the rapidly decreasing impedance that has been observed in Applied‐B ion diode experiments. The results of our numerical simulations will be compared to experimental data on Applied‐B ion diodes and to analytic theories of their operation.This publication has 12 references indexed in Scilit:
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