Further measurements of the temperature dependence of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunneling microscopes
- 1 December 1994
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (12) , 3862-3863
- https://doi.org/10.1063/1.1145180
Abstract
We report further measurements of the temperature dependence of the piezotube coefficient for material PZT‐5A. These new results support our earlier findings that the temperature dependence of the piezoresponse is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. Our new data imply that the piezocoefficient temperature dependence is reproducible for tubes of various sizes, even when the room temperature coefficients differ by more than 20% from their published values.Keywords
This publication has 2 references indexed in Scilit:
- Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunneling microscopesReview of Scientific Instruments, 1993
- Electromechanical deflections of piezoelectric tubes with quartered electrodesApplied Physics Letters, 1992