A simplified algorithm for testing microprocessors
- 1 January 1987
- journal article
- Published by Elsevier in Computers & Mathematics with Applications
- Vol. 13 (5) , 431-441
- https://doi.org/10.1016/0898-1221(87)90073-3
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Built-In Testing of Memory Using an On-Chip Compact Testing SchemeIEEE Transactions on Computers, 1986
- Test Generation for MicroprocessorsIEEE Transactions on Computers, 1980