Analysis of thin layers by total-reflection X-ray fluorescence spectrometry
- 1 January 1989
- journal article
- review article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 44 (5) , 471-476
- https://doi.org/10.1016/0584-8547(89)80052-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Total reflection X-ray fluorescence analysis of low-Z elementsSpectrochimica Acta Part B: Atomic Spectroscopy, 1989
- Perspex as sample carrier in TXRFAnalytical and Bioanalytical Chemistry, 1987
- Optical Flats for Use in X-Ray Spectrochemical MicroanalysisReview of Scientific Instruments, 1971