More realistic reliability analysis by conditional distributions
- 1 January 1983
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 23 (2) , 261-268
- https://doi.org/10.1016/0026-2714(83)90333-5
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Improved Method of Inclusion-Exclusion Applied to k-out-of-n SystemsIEEE Transactions on Reliability, 1982
- Use of a Fault Tree with Delayed InputsIEEE Transactions on Reliability, 1981