7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
- 1 May 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 154 (1) , 267-283
- https://doi.org/10.1016/0039-6028(85)90365-6
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
- Effect of Cu deposition on structural and electronic properties of cleaved Si(111) surfacesSurface Science, 1985
- CuSi(111) interfaces: Oxidation properties in relation with their structural propertiesSurface Science, 1985
- Nucleation, growth and the intermediate layer in Ag/Si(100) and Ag/Si(111)Surface Science, 1984
- Structure of the Ag on Si(111) 7 × 7 interface by means of surface exafsSurface Science, 1983
- Compound formation and bonding configuration at the Si-Cu interfacePhysical Review B, 1983
- Surface compositions of copper-silicon alloysApplications of Surface Science, 1983
- Electron energy loss measurements on the gold-silicon interface.Journal de Physique Lettres, 1980
- Thermodynamic investigation of copper + silicon meltsThe Journal of Chemical Thermodynamics, 1979
- Characteristic energies in secondary electron spectra from Si(111) surfacesSurface Science, 1971
- Auger electron spectroscopy of SiSurface Science, 1970