Internal gain from an erbium-doped oxyfluoride-silicate glass waveguide fabricated using femtosecond waveguide inscription
- 5 July 2006
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 18 (14) , 1515-1517
- https://doi.org/10.1109/lpt.2006.877591
Abstract
A channel waveguide is fabricated inside an erbium-doped oxyfluoride silicate glass sample using femtosecond pulses in the low repetition rate regime. The waveguide cross section is controlled using the multiscan fabrication technique. The 1.85-cm-long waveguide exhibits a total background insertion loss of 4.3 dB when coupled to Corning SMF-28 fibers. Under the maximum available pump power, the device exhibits an internal gain of 1.7 dB at 1537 nm.Keywords
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