Magnetic field dependence of the photoresponse of the electron inversion layer on (100) Si
- 1 January 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 113 (1-3) , 112-117
- https://doi.org/10.1016/0039-6028(82)90570-2
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall ResistancePhysical Review Letters, 1980
- Cyclotron resonance of electron inversion layers in Si (001) metal-oxide-semiconductor field-effect transistors (MOSFET's)Physical Review B, 1980
- Mechanism of intersubband resonant photoresponsePhysical Review B, 1979