Thermal Characterization of Microwave Power FETs Using Nematic Liquid Crystals
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 86, 495-498
- https://doi.org/10.1109/mwsym.1986.1132230
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Technique for the Measurement of Hot Spots and Isotherm Profilesat the Surfaces of the Elements of Hybrid MicrocircuitsActive and Passive Electronic Components, 1980
- Thermal resistance of heat sinks with temperature-dependent conductivitySolid-State Electronics, 1975