Absolute Statistical Error in Two-wavelength Rough-surface Interferometry (ROSI)
- 1 October 1986
- journal article
- research article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 33 (10) , 1221-1225
- https://doi.org/10.1080/713821873
Abstract
Starting from the circular symmetric Gaussian statistics describing fully developed speckle patterns, we calculate the absolute measuring error in two-wavelength rough-surface interferometry (ROSI) and discuss its dependency on the ratio between surface roughness and effective wavelength and on the precision of the measurement equipment. We show that in certain circumstances this error can be minimized by the proper choice of the effective wavelength.Keywords
This publication has 2 references indexed in Scilit:
- Higher-order statistical properties of speckle fields and their application to rough-surface interferometryJournal of the Optical Society of America A, 1986
- Rough surface interferometry with a two-wavelength heterodyne speckle interferometerApplied Optics, 1985