Electron energy loss spectroscopy across a metal-insulator interface at sub-nanometer spatial resolution
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 16 (2) , 233-239
- https://doi.org/10.1016/0304-3991(85)90077-4
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Combined elemental and stem imaging under computer controlUltramicroscopy, 1984
- AlF3—A new very high resolution electron beam resistApplied Physics Letters, 1984
- A high performance electron energy loss spectrometer for use with a dedicated STEMJournal of Vacuum Science & Technology B, 1983
- Stem microanalysis by transmission electron energy loss spectroscopy in crystalsUltramicroscopy, 1982
- Scattered Electrons in Microscopy and MicroanalysisScience, 1982
- Inner-Shell Electron Spectroscopy for MicroanalysisScience, 1979
- The microanalysis of light elements using transmitted energy loss electronsUltramicroscopy, 1975
- Einfluß von dünnen Kohledeckschichten auf das Energieverlustspektrum von SilberThe European Physical Journal A, 1968
- Zur Dispersion der OberflÄchenplasmaverluste an reinen und oxydierten AluminiumoberflÄchenThe European Physical Journal A, 1968
- Über den Einfluß der Oberflächen dünner Schichten auf die Energieverluste schneller Elektronen in AlThe European Physical Journal A, 1968