Measurement of the growth of sub-microscopic fatigue cracks by ellipsometry
- 30 September 1974
- journal article
- Published by Elsevier in Surface Science
- Vol. 45 (1) , 117-127
- https://doi.org/10.1016/0039-6028(74)90158-7
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Optical Constants of Clean Titanium and Tungsten Surfaces as Functions of TemperatureJournal of the Optical Society of America, 1972
- On the possible influence of surface roughening on ellipsometric data in electrochemical studiesSurface Science, 1972
- Study of Aluminum Films. I. Optical Studies of Reflectance Drops and Surface Oscillations on Controlled-Roughness FilmsPhysical Review B, 1971
- Photon-surface plasmon coupling at a dielectric solidPhysics Letters A, 1970
- Surface-Plasmon Effect in the Reflectance of a Metal*†Journal of the Optical Society of America, 1970
- Reflectance and Ellipsometry When Submicroscopic Particles Bestrew a Surface*Journal of the Optical Society of America, 1970
- Errors arising from surface roughness in ellipsometric measurement of the refractive index of a surfaceSurface Science, 1969
- Photon-Plasmon Interaction in a Nonuniform Electron Gas. IPhysical Review B, 1969
- VII. Colours in metal glasses, in metallic films, and in metallic solutions.—IIPhilosophical Transactions of the Royal Society A, 1906
- XII. Colours in metal glasses and in metallic filmsPhilosophical Transactions of the Royal Society A, 1904