Technique for evaluating system performance usingQ innumerical simulations exhibiting intersymbol interference

6 January 1994

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 30 (1) , 71-72
https://doi.org/10.1049/el:19940045

Abstract

The ‘Q’ parameter is currently the favoured metric for evaluating the performance of long span optically amplified systems. Q measurements have proved to be unreliable when excess patterning effects are present. A laboratory solution to this has already been provided . In the Letter, the authors detail a new technique which will provide a solution in the case of numerical models, an important consideration as their importance within the field of systems engineering grows rapidly.

Keywords

This publication has 2 references indexed in Scilit:

Margin measurements in optical amplifier system
IEEE Photonics Technology Letters, 1993
Error ratio measurements over transoceanic distances using recirculating loop
Electronics Letters, 1991