Target environment and energy deposition in particle induced desorption: 252Cf plasma desorption mass spectrometry, secondary ions mass spectrometry and fast atom bombardment mass spectrometry
- 1 August 1990
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 98 (2) , 155-166
- https://doi.org/10.1016/0168-1176(90)85015-t
Abstract
No abstract availableKeywords
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