Pulse Technique for Flat-Band Voltage Measurements in MIS Structures
- 16 June 1983
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 77 (2) , K99-K102
- https://doi.org/10.1002/pssa.2210770252
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Discharge of MNOS structuresSolid-State Electronics, 1973
- Transient responses of a pulsed MIS-capacitorSolid-State Electronics, 1970
- The metal-nitride-oxide-silicon (MNOS) transistor—Characteristics and applicationsProceedings of the IEEE, 1970
- Raumladungsbeschränkte Ströme in Anthrazen als Mittel zur Bestimmung der Beweglichkeit von DefektelektronenThe European Physical Journal A, 1962