Measurement of dielectric absorption of capacitors and analysis of its effects on VCOs
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 45 (1) , 89-97
- https://doi.org/10.1109/19.481317
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The effect of dielectric relaxation on charge-redistribution A/D convertersIEEE Journal of Solid-State Circuits, 1990
- Recovery Voltage Measurements with Emphasis Below One Second for Class I NPO Ceramic CapacitorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1978
- Dielectric Absorption in Memory CapacitorsIEEE Transactions on Instrumentation and Measurement, 1972
- An Analysis of Certain Errors in Electronic Differential Analyzers II-Capacitor Dielectric AbsorptionIEEE Transactions on Electronic Computers, 1958