Fabrication of YBCO/CeO2/YBCO Multilayer Junctions and Their Characteristics

Abstract
The fabrication of YBCO/CeO2/YBCO multilayer junctions (YBCO: YBa2Cu3O7-y ) grown by the in situ vacuum deposition technique is reported. The measurements yield reproducible characteristics. The observed phenomena appear either in the tunneling regime or in the Andreev-reflection-like regime depending on the magnitude of the junction resistance. Prominent gaplike structures around 10 mV and 20 mV and additional structures are observed. Temperature dependence of the gap structures is nearly BCS-like. The results are discussed in terms of an anisotropic conduction model.