X-ray mirror reflectivities from 3.8 to 50 keV (3.3 to 0.25 Å) Part II—Pt, Si and other materials
- 1 April 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 195 (1-2) , 91-95
- https://doi.org/10.1016/0029-554x(82)90763-7
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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