Continuously displayed emittance measurements
- 1 January 1975
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 46 (1) , 33-40
- https://doi.org/10.1063/1.1134040
Abstract
A device is described to display continuously on a CRT the emittance of an ion beam. The system uses electrostatic deflectors and small apertures to scan the beam’s phase−space position and momentum coordinates. Measurements are reported of the emittance and brightness of the following beams produced by five different ion sources: H−, D−, He+, He−, C−, D2−, O−, NH2−, A+, and Cu−. Also investigated was the emittance of an H− beam from a duoplasmatron direct−extraction source as a function of the radial displacement of the zwischen electrode, and the phase−space particle density distribution of an H− beam was measured.Keywords
This publication has 4 references indexed in Scilit:
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- The emittance measurement of the magnetron ion sourceNuclear Instruments and Methods, 1969
- A Single Pulse Transverse Phase Space Beam AnalyserIEEE Transactions on Nuclear Science, 1967
- Direct extraction of negative ion beams of good intensity from a duoplasmatronNuclear Instruments and Methods, 1965