Investigation of organic coatings and coating defects with the help of time-of-flight-secondary ion mass spectrometry (TOF-SIMS)
- 1 August 1999
- journal article
- Published by Elsevier in Progress in Organic Coatings
- Vol. 35 (1-4) , 183-189
- https://doi.org/10.1016/s0300-9440(99)00035-1
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Chemische Analyse von anorganischen und organischen Oberflächen und von dünnen Schichten mit der statischen Flugzeit‐Sekundärionen‐Massenspektrometrie (TOF‐SIMS)Angewandte Chemie, 1994
- Surface MS: probing real-world samplesAnalytical Chemistry, 1993
- XPS studies of in situ plasma-modified polymer surfacesJournal of Adhesion Science and Technology, 1993