Determination of the Debye‐Waller‐Factor on GaP by X‐ray diffraction methods
- 1 January 1980
- journal article
- other
- Published by Wiley in Crystal Research and Technology
- Vol. 15 (9) , K83-K84
- https://doi.org/10.1002/crat.19800150917
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Die Bestimmung des Debye‐Waller‐Faktors von (Ga, In)P mit RöntgenbeugungsmethodenCrystal Research and Technology, 1976
- Die mittlere quadratische Auslenkung der Atome und der Nachweis eines statischen Verzerrungsanteils in Al1–xGaxAs mit RöntgenbeugungsmethodenCrystal Research and Technology, 1975
- Anomalous dispersion corrections computed from self-consistent field relativistic Dirac–Slater wave functionsActa Crystallographica, 1965