Usefulness and Applications of Electron Microscopy to Materials Science
- 1 January 1990
- journal article
- Published by Japan Institute of Metals in Materials Transactions, JIM
- Vol. 31 (7) , 523-537
- https://doi.org/10.2320/matertrans1989.31.523
Abstract
No abstract availableKeywords
This publication has 27 references indexed in Scilit:
- Ultra‐high voltage electron microscopy: Past, present, and futureJournal of Electron Microscopy Technique, 1986
- Role of Conjugate Slip in Deformation of Cu-10at%Al Single CrystalsJournal of the Physics Society Japan, 1983
- Dislocation Multipoles in Slightly Deformed Cu–10 at%Al Single CrystalsJournal of the Physics Society Japan, 1982
- Voltage Dependence of Electron Irradiation Damage in Aluminum with a 3 MV-Class Electron MicroscopeJournal of the Physics Society Japan, 1973
- Some Applications of an Ultra-High Voltage Electron Microscope on Materials ScienceJapanese Journal of Applied Physics, 1972
- The reciprocity of electron diffraction and electron channelingRadiation Effects, 1972
- Maximizing the penetration in high voltage electron microscopyPhilosophical Magazine, 1971
- Multiplication of Dislocations in AluminumJournal of the Physics Society Japan, 1970
- Investigations of dislocation strain fields using weak beamsPhilosophical Magazine, 1969
- Metallurgical Investigations with a 500 kV Electron MicroscopeJapanese Journal of Applied Physics, 1967