Nonsaturating Transistor Circuitry for Nanosecond Pulses
- 1 March 1960
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Nuclear Science
- Vol. 7 (1) , 23-28
- https://doi.org/10.1109/TNS2.1960.4315712
Abstract
A system is described for pulse testing of transistors in the 10-10 to 10-9 sec range. Based on these measurements, a nanosecond, current switching, multiple coincidence system has been constructed. It is dc coupled and has input pulse limiters and clipping stubs. A ten-nonosecond scaler-discririnator stage is discussed which also employs current switching techniques. One output is scaled for pulse counting; another unscaled output is used to drive coincidence circuitry.Keywords
This publication has 5 references indexed in Scilit:
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- Technology of Micro-Alloy Diffused TransistorsProceedings of the IRE, 1958
- Transient Response of Drift TransistorsProceedings of the IRE, 1958
- Sampling Oscilloscope for Statistically Varying PulsesReview of Scientific Instruments, 1957
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