X-ray determination of dislocation density in epitaxial ZnCdTe
- 15 November 1985
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 47 (10) , 1066-1068
- https://doi.org/10.1063/1.96381
Abstract
Widths of double-crystal x-ray rocking curves for epitaxial layers of the ternary alloy ZnCdTe are found to correlate with lattice parameter misfit between layer and substrate. Estimates of dislocation density in the layers are made using these widths. Values thus obtained are found to be in good agreement with values reported for other materials with similar misfit.Keywords
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