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Silicon Impurity Distribution as Revealed by Pulsed MOS C-V Measurements
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Publications
Silicon Impurity Distribution as Revealed by Pulsed MOS C-V Measurements
Silicon Impurity Distribution as Revealed by Pulsed MOS C-V Measurements
WG
W. van Gelder
W. van Gelder
EN
E. H. Nicollian
E. H. Nicollian
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1 January 1971
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 118
(1)
,
138
https://doi.org/10.1149/1.2407927
Abstract
No abstract available
Keywords
PULSED MOS
IMPURITY DISTRIBUTION
SILICON IMPURITY
DISTRIBUTION AS REVEALED
REVEALED BY PULSED
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Cited by 102 articles
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