Electroforming in point-contacted silicon oxide layers: Low frequency characteristics for devices with gold anodes and with carbon anodes
- 1 September 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 29 (1) , 165-175
- https://doi.org/10.1016/0040-6090(75)90225-4
Abstract
No abstract availableKeywords
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